The best value-for-the-money transmission electron microscope (TEM) system for biology and the life sciences, it is also adaptable, easy-to-use and delivers excellent image quality.

The Magellan XHR Scanning Electron Microscope (SEM) allows scientists and engineers to quickly see things they could not see before, such as 3D surface images at many different angles and at resolutions below one nanometer (about the size of ten hydrogen atoms, side-by-side). Most importantly, the Magellan XHR SEM images samples at very low beam energies, avoiding distortions otherwise caused by the beam penetrating into the material below.

The Tecnai line of TEM models are designed specifically for the high-contrast imaging needs found in life science and soft matter research, semiconductor and data storage industries and top multi-user laboratories everywhere.

Phenom Desktop Scanning Electron Microscope (SEM) is a high-resolution, portable imaging tool that is fast and easy to use. With magnifications of 20x to 20,000x and an ultimate resolution of 30 nm, it’s ideal for routine inspection of materials, detailed imaging or classroom instruction.

The FEI Titan™ S/TEM product line includes the world's most powerful, commercially-available S/TEMs: the Titan™ 80-300, Titan Krios™, Titan3™ and Titan™ ETEM (Environmental TEM). Built around a revolutionary 80-300 kV electron column, all Titans enable sub-Ångström, atomic scale discovery and exploration in both TEM and STEM modes over a wide range of materials and operating conditions.

The Nova line of scanning electron microscopes (SEM) include low-vacuum capability, and are ideal for the diverse imaging, analytical and sample preparation demands found in research labs, semiconductor and data storage labs and fabs, biology and life sciences labs and other industries.

The Quanta line of scanning electron microscopes are versatile, high-performance instruments with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any SEM system. All the Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction.